DTS 2079

DTS2079Wavecrests DTS line and companion software provide unprecedented speed, accuracy and resolution in test and measurement of jitter and critical time measurements in semiconductor devices and systems. Patented algorithms provide the only available solution of complete high-speed analysis in all three critical domains of time, frequency and modulation. This system will do it all; design, debug, characterisation/validation , customer and vendor correlation and volume production test.

Wavecrest has long been recognized for producing some of the fastest test equipment available for the debug, characterization and production test of high-performance, high frequency devices and circuits.

This tradition continues with the release of the DTS-2079 Communication Signal Analyzer. The breakthrough DTS-2079 analyzer is the first to achieve the important 3.2 Gb/s speed threshold. The DTS-2079 is particularly useful for the analysis and debug of high-speed communications devices, boards and systems.

Wavecrest Introduction Page

DTS 2079
Frequency Range 0.4 Hz to 1.63 MHz
Maximum Data Rate 3.2 Gbs
Minimum Pulse Width 300ps
Jitter Noise Floor Is < 6ps rms (3ps rms typical at cal frequency)(1)
Jitter Measurement Accuracy Is < 2ps (2)
Hardware Resolution 680fs
Time Measurement Range ±2.5s
Frequency Measurement Accuracy 1PPM
Time Base Accuracy 1PPM
Time Base Stability (Short Term Aging) 5x10-11
   
Voltage Performance:  
Input Range ±1.1V (50 Ohm load)
VREF Accuracy ±(1.5 mV+0.75% of setting)
VREF Resolution 150µV
External Arming Used for synchronizing a timing measurement to an external pattern generator for examining timing issues at a particular point in time. Supports edge triggered arming and gated arming (window arming).
Automatic Arming Used for serial data streams and clock signals that repeat indefinitely. This feature is critical in enabling clock-less data signal analysis.
Internal Sampling Oscilloscope Used for identifying signal characteristics that are present at the channel input. The oscilloscope has an effective sampling rate of 100GHz.
User Programmable Subroutine Memory Used for developing production and characterization scripts to enhance throughput and measurement time.
Built-In Internal Calibration Used for self-calibration of internal hardware. External reference ports accessible on back panel for accuracy verification.
Built-In External Calibration Used for timing and voltage deskew of cables, probes and other interconnect hardware.
   
Specifications subject to change without notice.  
   
(1) Jitter Noise Floor is the minimum Jitter measurement that can be made. This measurement is an accumulation of several jitter frequency components and their effect on the measurement in question. The Jitter Noise Floor measured in the Frequency domain is less than 1ps.
(2) Jitter Measurement Accuracy is a function of the hardware's measurement repeatability.

If you require further information please click on the "More Information" link at the top of the page and one of our team will provide any details you may require.

Or contact us directly:

Firfax Systems Ltd
Meteor Business Park, Gloucestershire Airport, Cheltenham Road East, Gloucester, GL2 9QL, UK.
T. +44 (0) 1452 717 800
E. sales@firfaxsystems.co.uk