Wavecrests DTS line and companion software provide unprecedented
speed, accuracy and resolution in test and measurement of jitter
and critical time measurements in semiconductor devices and systems.
Patented
algorithms provide the only available solution of complete
high-speed analysis in
all three critical domains of time, frequency and modulation.
This system will do it all; design, debug, characterisation/validation
, customer
and vendor correlation and volume production test.
Winner of the “Best in Test” award from Test & Measurement World, the WAVECREST DTS-2075 provides the picosecond accuracy, femtosecond resolution, low noise floor and high-speed needed for the rapid characterization of semiconductor devices in the time, frequency and modulation domains.
Operating either synchronously or asynchronously, the DTS-2075 is ideal for both stand alone benchtop operation and integration into ATE systems for use in production. The DTS-2075 permits 100% correlation of characterization and final test by directly supporting both applications
If you require further information please click on the "More Information" link at the top of the page and one of our team will provide any details you may require.
Or contact us directly:
Firfax Systems Ltd
Meteor Business Park,
Gloucestershire Airport,
Cheltenham Road East,
Gloucester,
GL2 9QL, UK.
T. +44 (0) 1452 717 800
E. sales@firfaxsystems.co.uk
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