QFI is dedicated to developing scientific instrumentation for the semiconductor failure analysis and product development market. Their experience and expertise in thermal and electro-luminescent energy detection and imaging has led to QFI’s development of the most powerful Failure Analysis Tools ever to reach the lab.
The QFI products include:
The EmmiTM 2000 Photo Emission Microscope
The Emmi is the original, patented emission microscope. An
emission microscope detects extremely faint light that
often is emitted from semiconductor circuit failures. Engineers
use the
Emmi to quickly locate the problem circuit so they
can find
out what is wrong, and fix their process.
The Emmi 2000 combo offer the choice of four photo emission cameras and an InSb camera for infrared thermal mapping and rapid hotspot detection.
Infrascope IIITM
The Infrascope is a ‘true temperature’ thermal imaging and measurement system that is able to produce non-invasive true temperature reading by creation of a spatial emissivity map. This advanced QFI technology allows temperature measurement with resolution accuracy to 100 milliKelvin.
Laser Signal Injection
Laser Signal Injection is used to locate shorts, junction defects, problem VIAs and other integrated circuit defects. An LSIM works by scanning a laser beam through a microscope lens, over an integrated circuit while monitoring the circuit input and output for laser induced changes.
The Firfax Systems sales and engineering team provides the critical local link to this world player by providing all the crucial local support functions. FSL assists by providing competent technical support throughout the specification and sales process to installation and training support to our customers throughout the UK and beyond.
For a fast and direct response, contact Firfax Systems Ltd for specification assistance, price quotations, delivery status and all your technical questions.
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