Emmi 2000 Photo Emission Microscope
The Emmi 2000 combo offers the choice of four photo emission cameras
and an InSb camera for Infrared Thermal mapping and rapid hotspot
detection. An additional Laser Signal Injection microscope from OptoMetrix
Inc. can
be added to the Emmi to offer complete XIVA capabilities. The Emmi
2000 combo can be supplied from QFI with any choice of camera or additional
cameras can be rapidly added in the field depending upon your application
and budget.
The Emmi 2000 combo emission microscope allows for front and back imaging of wafers or packaged devices and can be equipped with the analytical probe station and detector type of your choice.
Emmi 2000 Series detectable events include:
- Hot electrons
- Saturated and switched transistors
- Gate oxide defects in MOS structures and gate pinholes
- Electro static discharge damage
With the 2000 QFI are unique in having a system capable of detecting low level backside emissions in the infra-red wavelength.
If you require further information please click on the "More Information" link at the top of the page and one of our team will provide any details you may require.
Or contact us directly:
Firfax Systems Ltd
Meteor Business Park,
Gloucestershire Airport,
Cheltenham Road East,
Gloucester,
GL2 9QL, UK.
T. +44 (0) 1452 717 800
E. sales@firfaxsystems.co.uk