The integration of multiple probes in scanning probe microscopy (SPM) has been
a dream since its earliest days of development. 
Nano-structure research using
atomic force microscopy (AFM) has stimulated a desire to both investigate and
manipulate samples in multiple contact scenarios. With the development of the
MulitView 4000™, Nanonics Imaging is the first manufacturer to realize the dream
of SPM multiprobe imaging. The MultiView 4000 enables the utilization of up
to four probes for independent imaging and manipulation of a sample. As in all
Nanonics’ systems, the patented, award winning 3D FlatScan™ scanner technology
is used in concert with cantilevered, optically and spatially friendly probes. This
allows for maximum flexibility with the ultimate resolution achievable in scanning
probe microscopy.
This flexibility is highlighted by the ability to transparently combine SPM with other optical and electron/ion optical systems. This includes combination with upright, inverted or dual microscopes as well as with Raman microprobes, SEM, FIB and SEM/FIB. This allows one to combine online, chemical and other complimentary information, which is often critical in materials characterization.
Benefits of the Multiprobe System
With multiple probes, previously unattainable measurements and analyses are now within reach. The MultiView 4000™ features independent imaging with separate probes that allow for:
- Surface esistivity measurements - using two, three and four point geometries.
- Multiprobe thermal measurements and resistance measurements - on device structures or polymeric materials.
- Optical measurements with multiple NSOM probes for pump/probe measurements - on optical devices and optically active materials such as semiconductors with femtosecond time and nanometric spatial resolution.
- Optical or thermal desorption with multiple probes to excite and collect the desorbed species for chemical analysis - on chemical structures where spatially selective desorption of such species can be directly collected into a mass spectrometer for chemical analysis, with a second cantilevered nanopipette probe.
- Nanochemical writing with one probe while imaging with a second probe - on a wide variety of substrates using chemicals in the gas or liquid phase
- NanoIndentation with one probe, with simultaneous and accurate AFM and/or thermal mapping using a second probe - on polymeric, semiconductor or other materials.
The dream, now a reality, is opening the gateway to rewarding and productive avenues of research, development and quality control. Such avenues depend upon scanning multiple probes and the sample independently, while investigating diverse and functionally important sample parameters.
Unique, Ultrastable, Spatially Friendly Glass Based Probes
While typical probes do not permit the probe tips to come within close proximity
to one another, Nanonics has developed spatially and optically friendly glass based
probes that allow for a close approach of the probe tips – a critical feature of
multiprobe imaging systems. Such Nanonics’ exposed probe technology permits
the approach of two probes to within 10 nm, as well as independent scanning of
each probe.
Not only do Nanonics’ glass based probes offer excellent imaging in AFM modes -
the probes have unparalleled aspect ratios and support deep trench imaging as
well as side wall imaging. They also permit singular electrical imaging and thermal
imaging with glass encased nanowires. Nanopipette probes further allow for gas
and liquid chemical writing.
Dual Probe Nanoindentation with On-line Ultra-Resolution AFM Profiling
The MultiView 4000™ head can be integrated with a Raman microscope to create on-line a chemical map of a nanoindentation with one probe while profiling with ultrahigh resolution using a second AFM probe.
The images above show the utility of two probes on-line in nanoindentation experiments. With
the nanoindentation shown here it would be impossible to perform the imaging task with only
the indenting probe. It als
o shows the great utility of the optically friendly nature of the multi
probe system which in this case permits an on-line Raman map for chemically characterizing the
nanoindentation. All Nanonics MultiView Systems can be integrated with any optical or electron/ion optical microscope system.
If you require further information please click on the "More Information" link at the top of the page and one of our team will provide any details you may require.
Or contact us directly:
Firfax Systems Ltd
Meteor Business Park,
Gloucestershire Airport,
Cheltenham Road East,
Gloucester,
GL2 9QL, UK.
T. +44 (0) 1452 717 800
E. sales@firfaxsystems.co.uk