Lehighton Process Control Instruments

LEI  1510M40
1510-level measurement capabilities at a reasonable price-perfect for university and low-volume production applications.
 

  

LEI Model 1600


Non-destructive carrier mobility, sheet charge density and sheet resistance measurements for 2" - 6" wafers

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 EMA Mobility 

LEI 1500 Series
Process monitoring for high production yields, contactless sheet resistance and thickness of conductive process layers and thickness / resistivity of doped, bulk wafers 2"-200mm

 LEI 1500 Series 

LEI RS300
Process monitoring for high production yields, contactless sheet resistance and thickness of conductive process layers and thickness / resistivity of doped, bulk wafers 4"-300mm

 RS300 

LEI Miller Feedback Profiler
System II

LEI Miller Feedback Profiler 

LEI 2017/2017B
Mercury Probes

LEI Mercury Probe 

LEI Model 1530A
Flat Panel Display Sheet Resistance and Mapping

 1530A Detail  

LEI Model 1500LS
Flat Panel Tool - Manual Positioning

 1500LS 

www.lehighton.com

If you require further information please click on the "More Information" link at the top of the page and one of our team will provide any details you may require.

Or contact us directly:

Firfax Systems Ltd
Meteor Business Park, Gloucestershire Airport, Cheltenham Road East, Gloucester, GL2 9QL, UK.
T. +44 (0) 1452 717 800
E. sales@firfaxsystems.co.uk