ITC Products

Test Equipment
55300 High-Current Inductive Load Tester
55300 High-Current Inductive Load Tester

Model ITC55300 is the high current (400A) version of the ITC55100 tester. The ITC55300 performs the same tests as the ITC55100 and includes many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking. The ITC55300 has the added capability of testing dual devices; N-channel, P-channel or combination.

Model ITC55300 performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.

55100 High-Current Inductive Load Tester 55100_High-Current_Inductive_Load_Tester

The ITC55100 is an improved version of the successful and industry standard ITC5510 tester. The ITC55100 performs all of the tests of the ITC5510 while adding many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking.

The ITC55100 performs ruggedness testing of power MOSFETs and IGBTs. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC5510F-RSF Output Selector Box

The ITC55100 has the added capability of testing dual devices; N-channel, P-channel or combination.

PB6500 - Serial Relay Mux with ProbeTracker
ITC 55140 Programmable Inductor Box

The ITC55140 programmable inductor box uses solid state switching and was designed to work with all of ITC's 55X00 series test systems to allow high-speed selection of inductance values from .01-149.9mH.

The ITC 55140 allows for testing of two DUT s that require different inductor values for each DUT with break down voltages that are less than 1500 volts peak. Inductor selection speed of the ITC 55140 is approximately 1 millisecond to allow the ITC55X00 to operate at maximum throughput when testing dual devices with different inductor load values.

ITC 5514A External Inductive Load Box
PB3500 - Expandable Mux System
The ITC5514A is one of two ITC5514 External Inductive Load Boxes specifically designed to extend the operating range of the ITC55100 Unclamped Inductive Load Testers.

ITC5514A Inductance Range

  • Manually selected inductance values
  • Range of 0.01 to 159 mH
PB2500 - Standard Mux System
ITC 5514B External Inductive Load Box
The ITC5514B is one of two ITC5514 External Inductive Load Boxes specifically designed to extend the operating range of the ITC55100 Unclamped Inductive Load Testers.

ITC5514B Inductance Range

  • Automatically selected inductance values
  • Range selected by the ITC55100 Unclamped Inductive Load Tester
  • Range of 0.01 to 159 mH

Probe Card Analyzers
PB6500 - Serial Relay Mux with ProbeTracker
PB6500
We've raised the bar, again. ITC's latest analyzer, the PB6500, can accommodate up to 6,016 probe channels, controls individual relays via software, and test the largest of probe card arrays and technologies in service today. Options such as the ProbeTracker microscope, the Oversized Measurement Chuck, and the Hot Chuck add to the PB6500's superiority.
PB3500
PB3500 - Expandable Mux System
The PB3500 provides the latest techniques in testing and maintaining probe cards. Designed through a joint development with many of the world's largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
PB2500 - Standard Mux System
PB1500
The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3500/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,024 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers.
PB1200
PB1000 Picture
The PB1200 is an automated probe card repair system. It has the capability to fully test alignment, planarity and (optionally) gram force, but its main purpose is in card repair. Test data may also be imported from a PB3500, PB6500 or other manufacturers probe card analyzers.
Motherboard - Expandable Mux System
Motherboards
ITC currently manufactures over 50 different types of probe card motherboards for all major brands of testers. ITC is constantly designing new motherboards for the ever-changing probe card industry.

www.inttechcorp.com

If you require further information please click on the "More Information" link at the top of the page and one of our team will provide any details you may require.

Or contact us directly:

Firfax Systems Ltd
Meteor Business Park, Gloucestershire Airport, Cheltenham Road East, Gloucester, GL2 9QL, UK.
T. +44 (0) 1452 717 800
E. sales@firfaxsystems.co.uk