As probe tip geometries and test voltages are constantly reduced, the importance of probe cleanliness is paramount in minimizing the need for retest and to ensure maximum device yield. ATM’s PC105 was designed for thorough non-contact, non-abrasive cleaning of high density vertical probe cards.
Thorough and proper cleaning will lower contact resistance and result in high probe yields. The PC105’s non-contact, non-abrasive cleaning process will increase probe card life and reduce probe card maintenance costs.
Cleaning, rinsing and drying cycles are programmable and stored in
memory. Cleaning and
waste solutions are stored in 2.0 liter and 20 liter bottles, respectively
within the probe cleaner’s
cabinet. Typical cycle time is 10 minutes.
If you require further information please click on the "More Information" link at the top of the page and one of our team will provide any details you may require.
Or contact us directly:
Firfax Systems Ltd
Meteor Business Park,
Gloucestershire Airport,
Cheltenham Road East,
Gloucester,
GL2 9QL, UK.
T. +44 (0) 1452 717 800
E. sales@firfaxsystems.co.uk
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